Ticket #1922: ATP I-Temp. SATA III M.2 2242.txt

smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.15.0-107-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     ATP SATA III SSDs
Device Model:     ATP I-Temp. SATA III M.2 2242
Serial Number:    AA000000000000000128
LU WWN Device Id: a 000000 000000011
Firmware Version: X8CAST20
User Capacity:    128,035,676,160 bytes [128 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      M.2
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ACS-4, ACS-3 T13/2161-D revision 5
SATA Version is:  SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Mon Jan 20 11:13:41 2025 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM level is:     254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is:   Enabled
DSN feature is:   Disabled
ATA Security is:  Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Unknown

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x80) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever 
                                        been run.
Total time to complete Offline 
data collection:                (    0) seconds.
Offline data collection
capabilities:                    (0x7b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0002) Does not save SMART data before
                                        entering power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine 
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (  30) minutes.
Conveyance self-test routine
recommended polling time:        (   2) minutes.
SCT capabilities:              (0x003d) SCT Status supported.
                                        SCT Error Recovery Control supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  1 Raw_Read_Error_Count    POSR-K   100   100   000    -    0
  5 Reallocated_Sector_Ct   -O--CK   100   100   010    -    0
  9 Power_On_Hours          -O--CK   100   100   000    -    0
 12 Power_Cycle_Count       -O--CK   100   100   000    -    2
 14 Device_Raw_Capacity     -O--CK   100   100   000    -    379912192
 15 Device_User_Capacity    -O--CK   100   100   000    -    250069680
 16 Initial_Spare_Blocks    -O--CK   100   100   000    -    992
 17 Remaining_Spare_Blocks  PO--CK   000   000   000    -    167
100 Total_Erease_Count      -O--CK   100   100   000    -    1
160 Uncorrectable_Sectors   -O--CK   100   100   000    -    0
172 Block_Erase_Failure     -O--CK   100   100   000    -    0
173 Max_Erase_Count         -O--CK   100   100   000    -    1
174 Unexpected_Power_Cycle  -O--CK   100   100   000    -    0
175 Average_Erase_Count     -O--CK   100   100   000    -    0
181 Program_Fail_Blocks     -O--CK   100   100   000    -    0
187 Reported_Uncorrect      -O--CK   100   100   000    -    0
194 Device_Temperature      -O---K   041   041   000    -    687865897
195 Hardware_ECC_Recovered  -O--CK   100   100   000    -    0
197 Pending_Block_Counts    -O--CK   100   100   000    -    0
198 Offline_Surface_Scan    ----CK   100   100   000    -    0
199 SATA_FIS_CRC_Errors     -O--CK   100   100   000    -    0
202 Percent_Lifetime_Used   ----CK   100   100   000    -    0
205 Thermal_Asperity_Rate   -O--CK   100   100   000    -    0
231 Controller_Temperature  -O---K   054   054   000    -    909049910
234 Nand_Sectors_Read       -O--CK   100   100   000    -    768
235 Device_Sectors_Written  -O--CK   100   100   000    -    0
241 Nand_Sectors_Written    -O--CK   100   100   000    -    3712
242 Device_Sectors_Read     -O--CK   100   100   000    -    4712
248 Life_Remaining          ----CK   100   100   001    -    100
249 Spare_Block_Remaining   PO--CK   000   000   000    -    167
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory Version 1
SMART           Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00       GPL,SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      1  Comprehensive SMART error log
0x03       GPL     R/O      1  Ext. Comprehensive SMART error log
0x04       GPL,SL  R/O      8  Device Statistics log
0x06           SL  R/O      1  SMART self-test log
0x07       GPL     R/O      1  Extended self-test log
0x09           SL  R/W      1  Selective self-test log
0x10       GPL     R/O      1  NCQ Command Error log
0x11       GPL     R/O      1  SATA Phy Event Counters log
0x12       GPL     R/O      1  SATA NCQ Non-Data log
0x16       GPL     -        1  Reserved for Serial ATA
0x24       GPL     R/O     88  Current Device Internal Status Data log
0x25       GPL     R/O    128  Saved Device Internal Status Data log
0x30       GPL,SL  R/O      9  IDENTIFY DEVICE data log
0x5a           SL  -      128  Reserved
0x5b           SL  -        1  Reserved
0x5c           SL  -        1  Reserved
0x80-0x9f  GPL,SL  R/W     16  Host vendor specific log
0xe0       GPL,SL  R/W      1  SCT Command/Status
0xe1       GPL,SL  R/W      1  SCT Data Transfer

SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
Device Error Count: 1
        CR     = Command Register
        FEATR  = Features Register
        COUNT  = Count (was: Sector Count) Register
        LBA_48 = Upper bytes of LBA High/Mid/Low Registers ]  ATA-8
        LH     = LBA High (was: Cylinder High) Register    ]   LBA
        LM     = LBA Mid (was: Cylinder Low) Register      ] Register
        LL     = LBA Low (was: Sector Number) Register     ]
        DV     = Device (was: Device/Head) Register
        DC     = Device Control Register
        ER     = Error register
        ST     = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 [0] occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was in an unknown state.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  00 -- 00 00 04 00 00 00 00 80 40 e0 00   4 sectors at LBA = 0x00008040 = 32832

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  25 00 00 00 04 00 00 00 00 80 40 e0 00     00:00:04.818  READ DMA EXT
  25 00 00 00 01 00 00 00 00 80 00 e0 00     00:00:04.818  READ DMA EXT
  25 00 00 00 01 00 00 00 00 80 00 e0 00     00:00:04.817  READ DMA EXT
  25 00 00 00 01 00 00 00 00 80 00 e0 00     00:00:04.817  READ DMA EXT
  25 00 00 00 01 00 00 00 00 80 00 e0 00     00:00:04.816  READ DMA EXT

SMART Error Log Version: 0
No Errors Logged

SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Completed [00% left] (0-65535)
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Status Version:                  3
SCT Version (vendor specific):       1 (0x0001)
Device State:                        Active (0)
Current Temperature:                    41 Celsius
Power Cycle Min/Max Temperature:     --/41 Celsius
Lifetime    Min/Max Temperature:     --/41 Celsius

SCT Temperature History Version:     2
Temperature Sampling Period:         1 minute
Temperature Logging Interval:        1 minute
Min/Max recommended Temperature:      0/100 Celsius
Min/Max Temperature Limit:            0/100 Celsius
Temperature History Size (Index):    128 (4)

Index    Estimated Time   Temperature Celsius
   5    2025-01-20 09:06     0  -
 ...    ..(121 skipped).    ..  -
 127    2025-01-20 11:08     0  -
   0    2025-01-20 11:09     ?  -
   1    2025-01-20 11:10     ?  -
   2    2025-01-20 11:11    38  *******************
   3    2025-01-20 11:12    40  *********************
   4    2025-01-20 11:13    41  **********************

SCT Error Recovery Control:
           Read: Disabled
          Write: Disabled

Device Statistics (GP Log 0x04)
Page  Offset Size        Value Flags Description
0x01  =====  =               =  ===  == General Statistics (rev 1) ==
0x01  0x008  4               2  ---  Lifetime Power-On Resets
0x01  0x010  4               0  ---  Power-on Hours
0x01  0x018  6               0  ---  Logical Sectors Written
0x01  0x020  6               0  ---  Number of Write Commands
0x01  0x028  6            4712  ---  Logical Sectors Read
0x01  0x030  6             934  ---  Number of Read Commands
0x01  0x038  6          178273  ---  Date and Time TimeStamp
0x01  0x048  2           64286  ---  Workload Utilization
0x01  0x050  6   1030792151040  ---  Utilization Usage Rate
0x01  0x060  1               0  ---  Random Write Resources Used
0x04  =====  =               =  ===  == General Errors Statistics (rev 1) ==
0x04  0x008  4               0  ---  Number of Reported Uncorrectable Errors
0x04  0x010  4               0  ---  Resets Between Cmd Acceptance and Completion
0x05  =====  =               =  ===  == Temperature Statistics (rev 1) ==
0x05  0x008  1              41  ---  Current Temperature
0x05  0x010  1               0  ---  Average Short Term Temperature
0x05  0x018  1               0  ---  Average Long Term Temperature
0x05  0x020  1              41  ---  Highest Temperature
0x05  0x028  1               0  ---  Lowest Temperature
0x05  0x030  1               0  ---  Highest Average Short Term Temperature
0x05  0x038  1               0  ---  Lowest Average Short Term Temperature
0x05  0x040  1               0  ---  Highest Average Long Term Temperature
0x05  0x048  1               0  ---  Lowest Average Long Term Temperature
0x05  0x050  4               0  ---  Time in Over-Temperature
0x05  0x058  1              70  ---  Specified Maximum Operating Temperature
0x05  0x060  4               0  ---  Time in Under-Temperature
0x05  0x068  1               0  ---  Specified Minimum Operating Temperature
0x06  =====  =               =  ===  == Transport Statistics (rev 1) ==
0x06  0x008  4               0  ---  Number of Hardware Resets
0x06  0x010  4               0  ---  Number of ASR Events
0x06  0x018  4               0  ---  Number of Interface CRC Errors
0x07  =====  =               =  ===  == Solid State Device Statistics (rev 1) ==
0x07  0x008  1               0  ---  Percentage Used Endurance Indicator
                                |||_ C monitored condition met
                                ||__ D supports DSN
                                |___ N normalized value

Pending Defects log (GP Log 0x0c) not supported

SATA Phy Event Counters (GP Log 0x11)
ID      Size     Value  Description
0x0001  2            0  Command failed due to ICRC error
0x0002  2            0  R_ERR response for data FIS
0x0003  2            0  R_ERR response for device-to-host data FIS
0x0004  2            0  R_ERR response for host-to-device data FIS
0x0005  2            0  R_ERR response for non-data FIS
0x0006  2            0  R_ERR response for device-to-host non-data FIS
0x0007  2            0  R_ERR response for host-to-device non-data FIS
0x0008  2            0  Device-to-host non-data FIS retries
0x0009  2            0  Transition from drive PhyRdy to drive PhyNRdy
0x000a  2            0  Device-to-host register FISes sent due to a COMRESET
0x000b  2            0  CRC errors within host-to-device FIS
0x000d  2            0  Non-CRC errors within host-to-device FIS
0x000f  2            0  R_ERR response for host-to-device data FIS, CRC
0x0010  2            0  R_ERR response for host-to-device data FIS, non-CRC
0x0012  2            0  R_ERR response for host-to-device non-data FIS, CRC
0x0013  2            0  R_ERR response for host-to-device non-data FIS, non-CRC