smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.15.0-107-generic] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: ATP SATA III SSDs Device Model: ATP I-Temp. SATA III M.2 2242 Serial Number: AA000000000000000128 LU WWN Device Id: a 000000 000000011 Firmware Version: X8CAST20 User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: M.2 Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-4, ACS-3 T13/2161-D revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Jan 20 11:13:41 2025 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Disabled ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unknown === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 30) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Count POSR-K 100 100 000 - 0 5 Reallocated_Sector_Ct -O--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 0 12 Power_Cycle_Count -O--CK 100 100 000 - 2 14 Device_Raw_Capacity -O--CK 100 100 000 - 379912192 15 Device_User_Capacity -O--CK 100 100 000 - 250069680 16 Initial_Spare_Blocks -O--CK 100 100 000 - 992 17 Remaining_Spare_Blocks PO--CK 000 000 000 - 167 100 Total_Erease_Count -O--CK 100 100 000 - 1 160 Uncorrectable_Sectors -O--CK 100 100 000 - 0 172 Block_Erase_Failure -O--CK 100 100 000 - 0 173 Max_Erase_Count -O--CK 100 100 000 - 1 174 Unexpected_Power_Cycle -O--CK 100 100 000 - 0 175 Average_Erase_Count -O--CK 100 100 000 - 0 181 Program_Fail_Blocks -O--CK 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Device_Temperature -O---K 041 041 000 - 687865897 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0 197 Pending_Block_Counts -O--CK 100 100 000 - 0 198 Offline_Surface_Scan ----CK 100 100 000 - 0 199 SATA_FIS_CRC_Errors -O--CK 100 100 000 - 0 202 Percent_Lifetime_Used ----CK 100 100 000 - 0 205 Thermal_Asperity_Rate -O--CK 100 100 000 - 0 231 Controller_Temperature -O---K 054 054 000 - 909049910 234 Nand_Sectors_Read -O--CK 100 100 000 - 768 235 Device_Sectors_Written -O--CK 100 100 000 - 0 241 Nand_Sectors_Written -O--CK 100 100 000 - 3712 242 Device_Sectors_Read -O--CK 100 100 000 - 4712 248 Life_Remaining ----CK 100 100 001 - 100 249 Spare_Block_Remaining PO--CK 000 000 000 - 167 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x12 GPL R/O 1 SATA NCQ Non-Data log 0x16 GPL - 1 Reserved for Serial ATA 0x24 GPL R/O 88 Current Device Internal Status Data log 0x25 GPL R/O 128 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x5a SL - 128 Reserved 0x5b SL - 1 Reserved 0x5c SL - 1 Reserved 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 1 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 [0] occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 00 -- 00 00 04 00 00 00 00 80 40 e0 00 4 sectors at LBA = 0x00008040 = 32832 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 25 00 00 00 04 00 00 00 00 80 40 e0 00 00:00:04.818 READ DMA EXT 25 00 00 00 01 00 00 00 00 80 00 e0 00 00:00:04.818 READ DMA EXT 25 00 00 00 01 00 00 00 00 80 00 e0 00 00:00:04.817 READ DMA EXT 25 00 00 00 01 00 00 00 00 80 00 e0 00 00:00:04.817 READ DMA EXT 25 00 00 00 01 00 00 00 00 80 00 e0 00 00:00:04.816 READ DMA EXT SMART Error Log Version: 0 No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Completed [00% left] (0-65535) Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 41 Celsius Power Cycle Min/Max Temperature: --/41 Celsius Lifetime Min/Max Temperature: --/41 Celsius SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/100 Celsius Min/Max Temperature Limit: 0/100 Celsius Temperature History Size (Index): 128 (4) Index Estimated Time Temperature Celsius 5 2025-01-20 09:06 0 - ... ..(121 skipped). .. - 127 2025-01-20 11:08 0 - 0 2025-01-20 11:09 ? - 1 2025-01-20 11:10 ? - 2 2025-01-20 11:11 38 ******************* 3 2025-01-20 11:12 40 ********************* 4 2025-01-20 11:13 41 ********************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 2 --- Lifetime Power-On Resets 0x01 0x010 4 0 --- Power-on Hours 0x01 0x018 6 0 --- Logical Sectors Written 0x01 0x020 6 0 --- Number of Write Commands 0x01 0x028 6 4712 --- Logical Sectors Read 0x01 0x030 6 934 --- Number of Read Commands 0x01 0x038 6 178273 --- Date and Time TimeStamp 0x01 0x048 2 64286 --- Workload Utilization 0x01 0x050 6 1030792151040 --- Utilization Usage Rate 0x01 0x060 1 0 --- Random Write Resources Used 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 41 --- Current Temperature 0x05 0x010 1 0 --- Average Short Term Temperature 0x05 0x018 1 0 --- Average Long Term Temperature 0x05 0x020 1 41 --- Highest Temperature 0x05 0x028 1 0 --- Lowest Temperature 0x05 0x030 1 0 --- Highest Average Short Term Temperature 0x05 0x038 1 0 --- Lowest Average Short Term Temperature 0x05 0x040 1 0 --- Highest Average Long Term Temperature 0x05 0x048 1 0 --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 0 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 0 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC