#636 closed enhancement (fixed)
Add SAMSUNG MZ7LN128HCHP-00000
Reported by: | spacedust | Owned by: | |
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Priority: | minor | Milestone: | Release 6.5 |
Component: | drivedb | Version: | 6.4 |
Keywords: | Cc: |
Description
Please add SAMSUNG MZ7LN128HCHP-00000 to the database.
It seems to be Samsung PM-871
smartctl 6.5 2016-01-06 r4198 [x86_64-linux-4.4.0-1.el6.elrepo.x86_64] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG MZ7LN128HCHP-00000 Serial Number: S1ZFNXAG701382 LU WWN Device Id: 5 002538 d402b799b Firmware Version: EMT0100Q User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Jan 17 17:27:03 2016 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 64) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 49 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 3 170 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 171 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 172 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 173 Unknown_Attribute 0x0033 099 099 005 Pre-fail Always - 1 174 Unknown_Attribute 0x0032 099 099 000 Old_age Always - 1 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 386 184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 194 Temperature_Celsius 0x0032 063 056 000 Old_age Always - 37 199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 233 Media_Wearout_Indicator 0x0013 099 099 000 Pre-fail Always - 16768826 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 123 242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 114 249 Unknown_Attribute 0x0032 099 099 000 Old_age Always - 128 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
Change History (10)
comment:1 by , 9 years ago
Component: | all → drivedb |
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Priority: | major → minor |
comment:4 by , 9 years ago
According to http://www.samsung.com/semiconductor/products/flash-storage/client-ssd/ it is PM871 family. Other drives from it:
MZ7LN128HCHP (128)
MZNLN128HCGR (128)
MZ7LN256HCHP (256)
MZNLN256HCHP (256)
MZNLN512HCJH (512)
MZ7LN512HCHP (512)
I did not found yet any SMART attributes documentation for this drives, so probably will just extend "Samsung based SSDs" list.
comment:6 by , 9 years ago
Resolution: | → fixed |
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Status: | new → closed |
comment:7 by , 9 years ago
It works ;)
=== START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG MZ7LN128HCHP-00000 Serial Number: S1ZFNXAG701382 LU WWN Device Id: 5 002538 d402b799b Firmware Version: EMT0100Q User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Jan 19 14:06:13 2016 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 64) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 94 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 3 170 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 171 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 172 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 173 Unknown_Attribute 0x0033 099 099 005 Pre-fail Always - 1 174 Unknown_Attribute 0x0032 099 099 000 Old_age Always - 1 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 386 184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0 194 Temperature_Celsius 0x0032 062 056 000 Old_age Always - 38 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 233 Media_Wearout_Indicator 0x0013 099 099 000 Pre-fail Always - 16768826 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 154 242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 140 249 Unknown_Attribute 0x0032 099 099 000 Old_age Always - 154 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
comment:8 by , 9 years ago
173 is Wear Leveller Worst Case Erase Count
174 is Unexpected Power Loss
249 is NAND_Writes_1GiB
comment:9 by , 9 years ago
Another 256 GB model:
smartctl 6.4 2014-10-07 r4002 [x86_64-linux-4.2.8-1-pve] (local build) Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG MZ7LN256HCHP-00000 Serial Number: S1ZENXAGC04598 LU WWN Device Id: 5 002538 d4084ac51 Firmware Version: EMT0100Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Mon Mar 21 12:51:44 2016 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 133) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 240 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 3 170 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 171 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 172 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0 173 Unknown_Attribute 0x0033 099 099 005 Pre-fail Always - 1 174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 791 184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 194 Temperature_Celsius 0x0032 075 068 000 Old_age Always - 25 199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 233 Media_Wearout_Indicator 0x0013 099 099 000 Pre-fail Always - 16768826 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 406 242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 80 249 Unknown_Attribute 0x0032 099 099 000 Old_age Always - 406 SMART Error Log Version: 1 No Errors Logged Warning! SMART Self-Test Log Structure error: invalid SMART checksum. SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 82 - Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
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-deleted- (I stand corrected - sorry for the noise.)