Intel® SSD 520 Series + smartctl

[tanya]

Why does the smart test in Linux lasts 5-6 hours instead of 48 minutes?

Use command: smartctl -t long /dev/sda

The test is passed by drive. But why is so long? (freebsd 8.4, Ubuntu 14.04). Speed is ok, about 400-450 kbytes/sec. Short test is ok, about 1-1,5 min.

Firmware Version: 400i,

[240 GB] Capacity,

Sata current: 6.0 Gb/s

attach for you log smartctl , why so many in log lines, it's a bug? there is one Self-test routine in progress gonna be i suppose :

# 1 Extended offline Self-test routine in progress 40% 16923 -
....
#19 Extended offline Self-test routine in progress 40% 16924 -

fstrim -v /mnt

/mnt: 236092682240 bytes were trimmed

smartctl -x /dev/sda

smartctl 6.5 2015-12-19 r4193 [x86_64-linux-3.16.0-46-generic] (daily-20151219)

Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org

START OF INFORMATION SECTION

Model Family: Intel 520 Series SSDs

Device Model: INTEL SSDSC2CW240A3

Serial Number: CVCV2495000A240CGN

LU WWN Device Id: 5 001517 803d11a4a

Firmware Version: 400i

User Capacity: 240,057,409,536 bytes [240 GB]

Sector Size: 512 bytes logical/physical

Rotation Rate: Solid State Device

Device is: In smartctl database [for details use: -P show]

ATA Version is: ACS-2 T13/2015-D revision 3

SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)

Local Time is: Tue Dec 22 11:29:49 2015 UTC

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

AAM feature is: Unavailable

APM level is: 254 (maximum performance)

Rd look-ahead is: Enabled

Write cache is: Enabled

ATA Security is: Disabled, frozen [SEC2]

Wt Cache Reorder: Unavailable

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status: (0x03) Offline data collection activity

is in progress.

Auto Offline Data Collection: Disabled.

Self-test execution status: ( 244) Self-test routine in progress...

40% of test remaining.

Total time to complete Offline

data collection: ( 1877) seconds.

Offline data collection

capabilities: (0x7f) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Abort Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: ( 1) minutes.

Extended self-test routine

recommended polling time: ( 48) minutes.

Conveyance self-test routine

recommended polling time: ( 2) minutes.

SCT capabilities: (0x0021) SCT Status supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 10

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE

5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0

9 Power_On_Hours_and_Msec -O--CK 000 000 000 - 911718h+07m+41.930s

12 Power_Cycle_Count -O--CK 100 100 000 - 13

170 Available_Reservd_Space PO--CK 100 100 010 - 0

171 Program_Fail_Count -O--CK 100 100 000 - 0

172 Erase_Fail_Count -O--CK 100 100 000 - 0

174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 13

184 End-to-End_Error PO--CK 100 100 090 - 0

187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0

192 Power-Off_Retract_Count -O--CK 100 100 000 - 13

225 Host_Writes_32MiB -O--CK 100 100 000 - 16152107

226 Workld_Media_Wear_Indic -O--CK 100 100 000 - 65535

227 Workld_Host_Reads_Perc -O--CK 100 100 000 - 23

228 Workload_Minutes -O--CK 100 100 000 - 65535

232 Available_Reservd_Space PO--CK 100 100 010 - 0

233 Media_Wearout_Indicator -O--CK 089 089 000 - 0

241 Host_Writes_32MiB -O--CK 100 100 000 - 16152107

242 Host_Reads_32MiB -O--CK 100 100 000 - 4829664

249 NAND_Writes_1GiB PO--C- 100 100 000 - 160487

_ K auto-keep

| C event count

_ R error rate

| S speed/performance

_ O updated online

| P prefailure warning

General Purpose Log Directory Version 1

SMART Log Directory Version 1 [multi-sector log support]

Address Access R/W Size Description

0x00 GPL,SL R/O 1 Log Directory

0x04 GPL,SL R/O 1 Device Statistics log

0x07 GPL R/O 1 Extended self-test log

0x09 SL R/W 1 Selective self-test log

0x10 GPL R/O 1 SATA NCQ Queued Error log

0x11 GPL,SL R/O 1 SATA Phy Event Counters log

0x80-0x9f GPL,SL R/W 16 Host vendor specific log

0xb7 GPL,SL VS 16 Device vendor specific log

0xe0 GPL,SL R/W 1 SCT Command/Status

0xe1 GPL,SL R/W 1 SCT Data Transfer

SMART Extended Comprehensive Error Log (GP Log 0x03) not supported

SMART Error Log not supported

SMART Extended Self-test Log Version: 1 (1 sectors)

Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error

# 1 Extended offline Self-test routine in progress 40% 16923 -

# 2 Extended offline Self-test routine in progress 40% 16923 -

# 3 Extended offline Self-test routine in progress 40% 16923 -

# 4 Extended offline Self-test routine in progress 40% 16923 -

# 5 Extended offline Self-test routine in progress 40% 16923 -

# 6 Extended offline Self-test routine in progress 40% 16923 -

# 7 Extended offline Self-test routine in progress 40% 16923 -

# 8 Extended offline Self-test routine in progress 40% 16923 -

# 9 Extended offline Self-test routine in progress 40% 16923 -

#10 Extended offline Self-test routine in progress 40% 16923 -

#11 Extended offline Self-test routine in progress 40% 16923 -

#12 Extended offline Self-test routine in progress 40% 16923 -

#13 Extended offline Self-test routine in progress 40% 16923 -

#14 Extended offline Self-test routine in progress 40% 16923 -

#15 Extended offline Self-test routine in progress 40% 16923 -

#16 Extended offline Self-test routine in progress 40% 16923 -

#17 Extended offline Self-test routine in progress 40% 16923 -

#18 Extended offline Self-test routine in progress 40% 16923 -

#19 Extended offline Self-test routine in progress 40% 16924 -

SMART Selective self-test log data structure revision number 0

Note: revision number not 1 implies that no selective self-test has ever been run

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testing

4 0 0 Not_testing

5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Status Version: 3

SCT Version (vendor specific): 0 (0x0000)

SCT Support Level: 1

Device State: Active (0)

Current Temperature: 30 Celsius

Power Cycle Min/Max Temperature: 30/30 Celsius

Lifetime Min/Max Temperature: 30/30 Celsius

Under/Over Temperature Limit Count: 0/0

SCT Temperature History Version: 0 (Unknown, should be 2)

Temperature Sampling Period: 0 minutes

Temperature Logging Interval: 0 minutes

Min/Max recommended Temperature: 0/ 0 Celsius

Min/Max Temperature Limit: 0/ 0 Celsius

Temperature History Size (Index): 0 (0)

Temperature History is empty

SCT Error Recovery Control command not supported

Device Statistics (GP Log 0x04)

Page Offset Size Value Flags Description

0x01 ===== = = === == General Statistics (rev 2) ==

0x01 0x008 4 20 --- Lifetime Power-On Resets

0x01 0x010 4 16924 --- Power-on Hours

0x01 0x018 6 1058752031001 --- Logical Sectors Written

0x01 0x028 6 316701686909 --- Logical Sectors Read

0x04 ===== = = === == General Errors Statistics (rev 1) ==

0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors

0x04 0x010 4 245 --- Resets Between Cmd Acceptance and Completion

0x06 ===== = = === == Transport Statistics (rev 1) ==

0x06 0x008 4 245 --- Number of Hardware Resets

0x06 0x010 4 234 --- Number of ASR Events

0x06 0x018 4 0 --- Number of Interface CRC Errors

0x07 ===== = = === == Solid State Device Statistics (rev 1) ==

0x07 0x008 1 255 --- Percentage Used Endurance Indicator

|_ C monitored condition met

D supports DSN

|_ N normalized value

SATA Phy Event Counters (GP Log 0x11)

ID Size Value Description

0x0001 2 0 Command failed due to ICRC error

0x0003 2 0 R_ERR response for device-to-host data FIS

0x0004 2 0 R_ERR response for host-to-device data FIS

0x0006 2 0 R_ERR response for device-to-host non-data FIS

0x0007 2 0 R_ERR response for host-to-device non-data FIS

0x0008 2 0 Device-to-host non-data FIS retries

0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy

0x000a 2 10 Device-to-host register FISes sent due to a COMRESET

0x000f 2 0 R_ERR response for host-to-device data FIS, CRC

0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC

0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC

0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC

0x0002 2 0 R_ERR response for data FIS

0x0005 2 0 R_ERR response for non-data FIS

0x000b 2 0 CRC errors within host-to-device FIS

0x000d 2 0 Non-CRC errors within host-to-device FIS