Opened 9 years ago
Closed 9 years ago
#626 closed defect (invalid)
Intel® SSD 520 Series + smartctl -t long
Reported by: | tanya | Owned by: | |
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Priority: | major | Milestone: | |
Component: | all | Version: | 6.4 |
Keywords: | Cc: |
Description (last modified by )
Why does the smart test in Linux lasts 5-6 hours instead of 48 minutes?
Use command: smartctl -t long /dev/sda
The test is passed by drive. But why is so long? (freebsd 8.4, Ubuntu 14.04). Speed is ok, about 400-450 kbytes/sec. Short test is ok, about 1-1,5 min.
Firmware Version: 400i,
[240 GB] Capacity,
Sata current: 6.0 Gb/s
attach for you log smartctl , why so many in log lines, it's a bug? there is one Self-test routine in progress gonna be i suppose :
# 1 Extended offline Self-test routine in progress 40% 16923 - .... #19 Extended offline Self-test routine in progress 40% 16924 - fstrim -v /mnt /mnt: 236092682240 bytes were trimmed smartctl -x /dev/sda smartctl 6.5 2015-12-19 r4193 [x86_64-linux-3.16.0-46-generic] (daily-20151219) Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Intel 520 Series SSDs Device Model: INTEL SSDSC2CW240A3 Serial Number: CVCV2495000A240CGN LU WWN Device Id: 5 001517 803d11a4a Firmware Version: 400i User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Dec 22 11:29:49 2015 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x03) Offline data collection activity is in progress. Auto Offline Data Collection: Disabled. Self-test execution status: ( 244) Self-test routine in progress... 40% of test remaining. Total time to complete Offline data collection: ( 1877) seconds. Offline data collection capabilities: (0x7f) SMART execute Offline immediate. Auto Offline data collection on/off support. Abort Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 48) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x0021) SCT Status supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0 9 Power_On_Hours_and_Msec -O--CK 000 000 000 - 911718h+07m+41.930s 12 Power_Cycle_Count -O--CK 100 100 000 - 13 170 Available_Reservd_Space PO--CK 100 100 010 - 0 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 13 184 End-to-End_Error PO--CK 100 100 090 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 100 100 000 - 13 225 Host_Writes_32MiB -O--CK 100 100 000 - 16152107 226 Workld_Media_Wear_Indic -O--CK 100 100 000 - 65535 227 Workld_Host_Reads_Perc -O--CK 100 100 000 - 23 228 Workload_Minutes -O--CK 100 100 000 - 65535 232 Available_Reservd_Space PO--CK 100 100 010 - 0 233 Media_Wearout_Indicator -O--CK 089 089 000 - 0 241 Host_Writes_32MiB -O--CK 100 100 000 - 16152107 242 Host_Reads_32MiB -O--CK 100 100 000 - 4829664 249 NAND_Writes_1GiB PO--C- 100 100 000 - 160487 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x04 GPL,SL R/O 1 Device Statistics log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xb7 GPL,SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Self-test routine in progress 40% 16923 - # 2 Extended offline Self-test routine in progress 40% 16923 - # 3 Extended offline Self-test routine in progress 40% 16923 - # 4 Extended offline Self-test routine in progress 40% 16923 - # 5 Extended offline Self-test routine in progress 40% 16923 - # 6 Extended offline Self-test routine in progress 40% 16923 - # 7 Extended offline Self-test routine in progress 40% 16923 - # 8 Extended offline Self-test routine in progress 40% 16923 - # 9 Extended offline Self-test routine in progress 40% 16923 - #10 Extended offline Self-test routine in progress 40% 16923 - #11 Extended offline Self-test routine in progress 40% 16923 - #12 Extended offline Self-test routine in progress 40% 16923 - #13 Extended offline Self-test routine in progress 40% 16923 - #14 Extended offline Self-test routine in progress 40% 16923 - #15 Extended offline Self-test routine in progress 40% 16923 - #16 Extended offline Self-test routine in progress 40% 16923 - #17 Extended offline Self-test routine in progress 40% 16923 - #18 Extended offline Self-test routine in progress 40% 16923 - #19 Extended offline Self-test routine in progress 40% 16924 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 0 (0x0000) SCT Support Level: 1 Device State: Active (0) Current Temperature: 30 Celsius Power Cycle Min/Max Temperature: 30/30 Celsius Lifetime Min/Max Temperature: 30/30 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 0 (Unknown, should be 2) Temperature Sampling Period: 0 minutes Temperature Logging Interval: 0 minutes Min/Max recommended Temperature: 0/ 0 Celsius Min/Max Temperature Limit: 0/ 0 Celsius Temperature History Size (Index): 0 (0) Temperature History is empty SCT Error Recovery Control command not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 20 --- Lifetime Power-On Resets 0x01 0x010 4 16924 --- Power-on Hours 0x01 0x018 6 1058752031001 --- Logical Sectors Written 0x01 0x028 6 316701686909 --- Logical Sectors Read 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 245 --- Resets Between Cmd Acceptance and Completion 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 245 --- Number of Hardware Resets 0x06 0x010 4 234 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 255 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 11 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 10 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC 0x0002 2 0 R_ERR response for data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS
Change History (3)
comment:1 by , 9 years ago
Description: | modified (diff) |
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Summary: | Intel® SSD 520 Series + smartctl → Intel® SSD 520 Series + smartctl -t long |
comment:2 by , 9 years ago
comment:3 by , 9 years ago
Resolution: | → invalid |
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Status: | new → closed |
Self-tests are done by drive firmware. Smartctl only issues the ATA command to start a test.
Note:
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This is normal if the drive is accessed during the test. Note that "48 minutes" specify a "recommended polling time". It is usually close to the actual self-test time if the drive is not accessed during the test.
Yes, some Intel SSDs may return garbage in some logs. At least 320 and 710 series are also affected.