=== Instruction ===
Move the mouse to the coloured parts of the text below to see a short explanation. Click the links to get background info.
----
=== The Report ===
{{{
#!html
# smartctl -q noserial -a /dev/ada30
smartctl 5.42 2011-10-20 r3458 [FreeBSD 9.0-RELEASE-p4 amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar 5K3000
Device Model: Hitachi HDS5C3030ALA630
LU WWN Device Id: 5 000cca 228c089f4
Firmware Version: MEAOA580
User Capacity: 3,000,592,982,016 bytes [3.00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Fri Aug 31 13:37:32 2012 PDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (37566) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 134 134 054 Pre-fail Offline - 109
3 Spin_Up_Time 0x0007 162 162 024 Pre-fail Always - 498 (Average 363)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 26
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 3
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 132 132 020 Pre-fail Offline - 32
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 7493
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 25
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 142
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 142
194 Temperature_Celsius 0x0002 230 230 000 Old_age Always - 26 (Min/Max 18/39)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 3
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 2
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 5
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 5 occurred at disk power-on lifetime: 5353 hours (223 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 52 9b d9 3f 05 Error: UNC at LBA = 0x053fd99b = 88070555
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 60 d8 ed da 3f 40 00 23:30:45.474 READ FPDMA QUEUED
60 00 e0 ed d9 3f 40 00 23:30:45.474 READ FPDMA QUEUED
60 02 e8 ec 0a 9e 40 00 23:30:45.474 READ FPDMA QUEUED
60 a0 f0 4d d9 3f 40 00 23:30:45.474 READ FPDMA QUEUED
2f 00 01 10 00 00 00 00 23:30:45.474 READ LOG EXT
Error 4 occurred at disk power-on lifetime: 5353 hours (223 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 52 9b d9 3f 05 Error: UNC at LBA = 0x053fd99b = 88070555
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 60 d8 ed da 3f 40 00 23:30:41.562 READ FPDMA QUEUED
60 00 e0 ed d9 3f 40 00 23:30:41.562 READ FPDMA QUEUED
60 02 e8 ec 0a 9e 40 00 23:30:41.562 READ FPDMA QUEUED
60 a0 f0 4d d9 3f 40 00 23:30:41.562 READ FPDMA QUEUED
2f 00 01 10 00 00 00 00 23:30:41.562 READ LOG EXT
Error 3 occurred at disk power-on lifetime: 5353 hours (223 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 52 9b d9 3f 05 Error: UNC at LBA = 0x053fd99b = 88070555
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 60 d8 ed da 3f 40 00 23:30:37.639 READ FPDMA QUEUED
60 00 e0 ed d9 3f 40 00 23:30:37.639 READ FPDMA QUEUED
60 02 e8 ec 0a 9e 40 00 23:30:37.639 READ FPDMA QUEUED
60 a0 f0 4d d9 3f 40 00 23:30:37.639 READ FPDMA QUEUED
2f 00 01 10 00 00 00 00 23:30:37.639 READ LOG EXT
Error 2 occurred at disk power-on lifetime: 5353 hours (223 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 52 9b d9 3f 05 Error: UNC at LBA = 0x053fd99b = 88070555
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 60 d8 ed da 3f 40 00 23:30:33.740 READ FPDMA QUEUED
60 00 e0 ed d9 3f 40 00 23:30:33.740 READ FPDMA QUEUED
60 02 e8 ec 0a 9e 40 00 23:30:33.740 READ FPDMA QUEUED
60 a0 f0 4d d9 3f 40 00 23:30:33.740 READ FPDMA QUEUED
2f 00 01 10 00 00 00 00 23:30:33.727 READ LOG EXT
Error 1 occurred at disk power-on lifetime: 5353 hours (223 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 52 9b d9 3f 05 Error: UNC at LBA = 0x053fd99b = 88070555
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 60 d8 ed da 3f 40 00 23:30:29.836 READ FPDMA QUEUED
60 00 b8 ed d9 3f 40 00 23:30:29.836 READ FPDMA QUEUED
60 02 e8 ec 0a 9e 40 00 23:30:29.836 READ FPDMA QUEUED
60 a0 a0 4d d9 3f 40 00 23:30:29.836 READ FPDMA QUEUED
60 20 a8 2d d9 3f 40 00 23:30:29.833 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 7465 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SMART overall-health state
..missing an explanation..
Attributes Threshold Values
These are defined by the vendor.
Attributes Worst Value
Note that some vendors firmware may actually increase the "Worst" value for some rate-type Attributes.
Attributes Type
Note that if an Attribute is of type 'Pre-fail', it does not mean that your disk is about to fail!
It only has this meaning if the Attribute's current Normalized value is less than or equal to the threshold value.
Column Updated
Some SMART attributes values, that are updated only during off-line data collection activities are labeled "Offline" in column "UPDATED".
Column "When Failed"
If the Attribute's current "Normalized value" is less than or equal to the threshold value, then the attribute is marked with "FAILING_NOW" in column WHEN_FAILED.
Raw Values
Please keep in mind that the conversion from RAW value to a quantity with physical units is not specified by the SMART standard!
smartctl only reports the different Attribute types, values, and thresholds as read from the device.
It does not carry out the conversion between "Raw" and "Normalized" values: this is done by the disk's firmware.
In most cases, the values printed by smartctl are sensible.
For example the temperature Attribute generally has its raw value equal to the temperature in Celsius.
However in some cases vendors use unusual conventions. For example the Hitachi disk on my laptop reports
its power-on hours in minutes, not hours. Some IBM disks track three temperatures rather than one,
in their raw values. Have a look at our wiki pages on topic SMART attributes.
}}}