This request is to add a new drive signature to the db. Per the FAQ I have updated my local copy of drivedb.h.
# smartctl -x /dev/sdb > smartctl-Crucial-MX300.txt
smartctl 6.4 2015-06-04 r4109 [x86_64-linux-4.4.6-gentoo] (local build)
Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Crucial_CT275MX300SSD1
Serial Number: 163313A7FE84
LU WWN Device Id: 5 00a075 113a7fe84
Firmware Version: M0CR021
User Capacity: 275,064,201,216 bytes [275 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Nov 6 21:05:30 2016 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 630) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 4) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0
5 Reallocated_Sector_Ct -O--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 100 100 000 - 5
12 Power_Cycle_Count -O--CK 100 100 000 - 1
171 Unknown_Attribute -O--CK 100 100 000 - 0
172 Unknown_Attribute -O--CK 100 100 000 - 0
173 Unknown_Attribute -O--CK 100 100 000 - 1
174 Unknown_Attribute -O--CK 100 100 000 - 0
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error -O--CK 100 100 000 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
194 Temperature_Celsius -O---K 076 069 000 - 24 (Min/Max 19/31)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
202 Unknown_SSD_Attribute ----CK 100 100 001 - 0
206 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0
246 Unknown_Attribute -O--CK 100 100 000 - 265180
247 Unknown_Attribute -O--CK 100 100 000 - 8292
248 Unknown_Attribute -O--CK 100 100 000 - 36725
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 1246
210 Unknown_Attribute -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 SATA NCQ Queued Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x13 GPL R/O 1 SATA NCQ Send and Receive log
0x24 GPL R/O 8000 Current Device Internal Status Data log
0x25 GPL R/O 8000 Saved Device Internal Status Data log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa0 GPL VS 35328 Device vendor specific log
0xa1 GPL,SL VS 3 Device vendor specific log
0xa2 GPL,SL VS 1 Device vendor specific log
0xa3 GPL VS 13824 Device vendor specific log
0xa4 GPL VS 354 Device vendor specific log
0xa4 SL VS 98 Device vendor specific log
0xa5 GPL VS 8000 Device vendor specific log
0xa5 SL VS 64 Device vendor specific log
0xa6 GPL VS 8000 Device vendor specific log
0xa6 SL VS 64 Device vendor specific log
0xa7-0xdf GPL,SL VS 1 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 5 -
# 2 Extended offline Completed without error 00% 4 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Completed [00% left] (57881389-57946924)
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 24 Celsius
Power Cycle Min/Max Temperature: 19/27 Celsius
Lifetime Min/Max Temperature: 19/31 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/70 Celsius
Min/Max Temperature Limit: -5/75 Celsius
Temperature History Size (Index): 478 (325)
Index Estimated Time Temperature Celsius
326 2016-11-06 13:08 ? -
... ..(150 skipped). .. -
477 2016-11-06 15:39 ? -
0 2016-11-06 15:40 19 -
1 2016-11-06 15:41 22 ***
... ..( 4 skipped). .. ***
6 2016-11-06 15:46 22 ***
7 2016-11-06 15:47 23 ****
... ..(261 skipped). .. ****
269 2016-11-06 20:09 23 ****
270 2016-11-06 20:10 24 *****
271 2016-11-06 20:11 26 *******
272 2016-11-06 20:12 27 ********
273 2016-11-06 20:13 25 ******
274 2016-11-06 20:14 24 *****
... ..( 2 skipped). .. *****
277 2016-11-06 20:17 24 *****
278 2016-11-06 20:18 23 ****
... ..( 44 skipped). .. ****
323 2016-11-06 21:03 23 ****
324 2016-11-06 21:04 25 ******
325 2016-11-06 21:05 25 ******
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 1 --- Lifetime Power-On Resets
0x01 0x010 4 5 --- Power-on Hours
0x01 0x018 6 265180 --- Logical Sectors Written
0x01 0x020 6 568 --- Number of Write Commands
0x01 0x028 6 20941 --- Logical Sectors Read
0x01 0x030 6 1331 --- Number of Read Commands
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 3 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 24 --- Current Temperature
0x05 0x010 1 - --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 31 --- Highest Temperature
0x05 0x028 1 19 --- Lowest Temperature
0x05 0x030 1 - --- Highest Average Short Term Temperature
0x05 0x038 1 - --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 70 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 6 --- Number of Hardware Resets
0x06 0x010 4 3 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x000a 4 6 Device-to-host register FISes sent due to a COMRESET
I've just got hold of one of these drives and updated it to firmware M0CR040; same model and capacity as OP. I'm immediately getting SMART failures because of attribute 180 failing. It looks like the THRESH value is non-zero, as opposed to the OP's value on their older firmware. I'm wondering if this attribute (at least for this firmware version) should be ignored because it's producing false positives - since the VALUE and WORST are hard-coded to zero they'll always fail THRESH.
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 051 NOW 1246
Attribute spec sheet from Micron: https://www.micron.com/~/media/documents/products/technical-note/solid-state-storage/tnfd22_client_ssd_smart_attributes.pdf
SMART ID 180 (B4h): Unused Reserve (Spare) NAND Blocks
Current Value: This value is hard-coded to zero (00h).
Worst Value: This value is hard-coded to zero (00h).
Raw Data: This value is calculated as:
URBC = BT - BG
Where:
URBC = Total unused reserved block count.
BT = Total number of spare blocks when the drive left the factory. The spare block count
represents the number of grown bad blocks the drive can handle in the field before it
enters write protect.
BG = Total number of grown bad blocks.