new usb vendor/product id (works) Unknown USB bridge [0x13fd:0x1640 (0x864)]

[jbj1]

Hello, I just tried out smartctl on my external USB drive enclosure. The device is actually very, very far away from me so unfortunately I cannot say what the brand name or model is but in any case it works (at least smartctl -a).

sudo smartctl -a /dev/sdc
smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-30-generic] (local build)
Copyright (C) 2002-12 by Bruce Allen, ​http://smartmontools.sourceforge.net

/dev/sdc: Unknown USB bridge [0x13fd:0x1640 (0x864)]
Smartctl: please specify device type with the -d option.

Use smartctl -h to get a usage summary

and then:

sudo smartctl -d sat,12 -a /dev/sdc
smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-30-generic] (local build)
Copyright (C) 2002-12 by Bruce Allen, ​http://smartmontools.sourceforge.net

START OF INFORMATION SECTION

Model Family: Hitachi Ultrastar A7K1000
Device Model: Hitachi HUA721010KLA330
Serial Number: GTA000PAG632ZA
LU WWN Device Id: 5 000cca 216c2c5d9
Firmware Version: GKAOA70M
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1
Local Time is: Tue Sep 24 20:28:49 2013 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

Error SMART Values Read failed: Input/output error
Smartctl: SMART Read Values failed.

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: UNKNOWN!
SMART Status, Attributes and Thresholds cannot be read.

SMART Error Log Version: 1
ATA Error Count: 36 (device log contains only the most recent five errors)

CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 36 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 eb 9f 3c f8 40 00 36d+16:55:32.800 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:55:10.500 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT

Error 35 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 eb 9f 3c f8 40 00 36d+16:55:10.500 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT

Error 34 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT
25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT

Error 33 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT
25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT
25 00 eb 8f 32 a4 40 00 36d+16:53:52.000 READ DMA EXT

Error 32 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT
25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT
25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT
25 00 eb 8f 32 a4 40 00 36d+16:53:52.000 READ DMA EXT
25 00 15 6a 29 50 40 00 36d+16:53:52.000 READ DMA EXT

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

[Christian Franke]

sudo smartctl -d sat,12 -a /dev/sdc
...
SMART Status, Attributes and Thresholds cannot be read.

SAT Layer of this USB bridge is apparently broken.
Please provide output of "smartctl -r ioctl,2 -d sat,12 -x /dev/sdc" as attachment.

Does "-d sat,16" work?

[jbj1]

output of smartctl -r ioctl,2 -d sat,12 -x /dev/sdc

[jbj1]

-d sat,16 doesn't work:

sudo smartctl -d sat,16 -a /dev/sdc
Smartctl: Device Read Identity Failed: scsi error unsupported scsi opcode

A mandatory SMART command failed: exiting. To continue, add one or more '-T permissive' options.

[Christian Franke]

r3865, r3866.