Opened 15 months ago
Last modified 15 months ago
#1745 closed defect
"ATA error count X inconsistent with error log pointer" - trouble or bug? — at Initial Version
Reported by: | René Bertin | Owned by: | |
---|---|---|---|
Priority: | minor | Milestone: | Release 7.5 |
Component: | smartctl | Version: | |
Keywords: | ata | Cc: |
Description
I received a new 256Gb Kingston (M-SATA) SSD and as usual I filled it with zeroes and then ran a long self-test before taking it into use.
Here's the output of smartctl -a
(smartmontools 7.4):
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-4.14.23-ck1-mainline-core2-rjvb] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Silicon Motion based SSDs Device Model: KINGSTON SKC600MS256G Serial Number: 50026B77856B72A3 LU WWN Device Id: 5 0026b7 7856b72a3 Firmware Version: S4800105 User Capacity: 256,060,514,304 bytes [256 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5533 ATA Version is: ACS-3 T13/2161-D revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Sep 9 18:35:36 2023 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 30) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x0031) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x0000 100 100 000 Old_age Offline - 0 5 Reallocated_Sector_Ct 0x0000 100 100 000 Old_age Offline - 0 9 Power_On_Hours 0x0000 100 100 000 Old_age Offline - 4 12 Power_Cycle_Count 0x0000 100 100 000 Old_age Offline - 2 148 Total_SLC_Erase_Ct 0x0000 100 100 000 Old_age Offline - 19 149 Max_SLC_Erase_Ct 0x0000 100 100 000 Old_age Offline - 2 150 Min_SLC_Erase_Ct 0x0000 100 100 000 Old_age Offline - 0 151 Average_SLC_Erase_Ct 0x0000 100 100 000 Old_age Offline - 1 159 DRAM_1_Bit_Error_Count 0x0000 100 100 000 Old_age Offline - 0 160 Uncorrectable_Error_Cnt 0x0000 100 100 000 Old_age Offline - 0 161 Valid_Spare_Block_Cnt 0x0000 100 100 000 Old_age Offline - 37 164 Total_Erase_Count 0x0000 100 100 000 Old_age Offline - 1487 165 Max_Erase_Count 0x0000 100 100 000 Old_age Offline - 6 166 Min_Erase_Count 0x0000 100 100 000 Old_age Offline - 2 167 Average_Erase_Count 0x0000 100 100 000 Old_age Offline - 2 169 Remaining_Lifetime_Perc 0x0000 100 100 000 Old_age Offline - 100 177 Wear_Leveling_Count 0x0000 100 100 050 Old_age Offline - 0 181 Program_Fail_Cnt_Total 0x0000 100 100 000 Old_age Offline - 0 182 Erase_Fail_Count_Total 0x0000 100 100 000 Old_age Offline - 0 192 Power-Off_Retract_Count 0x0000 100 100 000 Old_age Offline - 0 194 Temperature_Celsius 0x0000 043 063 000 Old_age Offline - 43 195 Hardware_ECC_Recovered 0x0000 100 100 000 Old_age Offline - 0 196 Reallocated_Event_Count 0x0000 100 100 016 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0000 100 100 050 Old_age Offline - 0 231 SSD_Life_Left 0x0000 100 100 000 Old_age Offline - 100 232 Available_Reservd_Space 0x0000 100 100 000 Old_age Offline - 100 241 Host_Writes_32MiB 0x0000 100 100 000 Old_age Offline - 13512 242 Host_Reads_32MiB 0x0000 100 100 000 Old_age Offline - 0 245 TLC_Writes_32MiB 0x0000 100 100 000 Old_age Offline - 24535 SMART Error Log Version: 1 Warning: ATA error count 0 inconsistent with error log pointer 1 ATA Error Count: 0 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 0 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was in an unknown state. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 ec 00 00 00 00 00 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE ec 00 00 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE ec 00 00 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE ec 00 00 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE c8 00 00 00 00 00 00 00 00:00:00.000 READ DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 4 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. The above only provides legacy SMART information - try 'smartctl -x' for more ``` I'm attaching the output of `smartctl -a -x`. The SSD is in an Inateck enclosure currently connected over USB2. Does this indicate a problem with the drive, a glitch (cat tripping over the cable or something like that ;)) or an issue in smartmontools?
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smartctl -a -x /dev/sdc