Opened 4 years ago
Last modified 2 years ago
#1434 closed defect
Smart-Attribute Critical Warning Bit 4 not necessary an error — at Version 1
| Reported by: | ThomasH | Owned by: | |
|---|---|---|---|
| Priority: | minor | Milestone: | |
| Component: | all | Version: | |
| Keywords: | nvme | Cc: |
Description (last modified by )
Hello,
we are using a NVME "SAMSUNG MZVLB512HAJQ-00000"
The Smartmontool is reporting the following error:
=== START OF SMART DATA SECTION === SMART overall-health self-assessment test result: FAILED! - NVM subsystem reliability has been degraded SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x04
The Attribut "Critical Warning" has different bits, signaling different status.
According to the documentation the flag for bit 4 is:
"If set to ‘1’, then the volatile memory backup device has failed. This field is only valid if the controller has a volatile memory backup solution"
The referred documentation is at https://nvmexpress.org/wp-content/uploads/NVM-Express-1_4-2019.06.10-Ratified.pdf (page 122).
Currently the bit 4 is reported as an error but this depends on the model (whether it has a capacitor for power loss protection).
Either this should be detected or maybe a parameter could be used to signal whether this is an error or not.
