209480318976 Currently unreadable (pending) sectors

[sancho-82]

Hello,

I have 4 Samsung drives running in RAID 5 on Centos 5.5, smartctl version 5.38.

I get this error every few days for 2 of 4 drives (HD502HJ):
"Device: /dev/sdd, 209480318976 Currently unreadable (pending) sectors" (always 209480318976)
followed by this:
"Device: /dev/sdb, Failed SMART usage Attribute: 197 Current_Pending_Sector."
Everything else seems to be OK:
# smartctl -a /dev/sdd
smartctl version 5.38 [x86_64-redhat-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is ​http://smartmontools.sourceforge.net/

START OF INFORMATION SECTION

Device Model: SAMSUNG HD502HJ
Serial Number: S20BJ9BZXXXXXX
Firmware Version: 1AJ10001
User Capacity: 500,107,862,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x28
Local Time is: Sat Dec 11 19:51:32 2010 CET

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x80) Offline data collection activity

was never started.
Auto Offline Data Collection: Enabled.

Self-test execution status: ( 0) The previous self-test routine completed

without error or no self-test has ever
been run.

Total time to complete Offline
data collection: (4800) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.
Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003f) SCT Status supported.

SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 6
2 Throughput_Performance 0x0026 054 053 000 Old_age Always - 4519
3 Spin_Up_Time 0x0023 086 083 025 Pre-fail Always - 4462
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2036

10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 5

191 G-Sense_Error_Rate 0x0022 252 252 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
194 Temperature_Celsius 0x0002 064 055 000 Old_age Always - 33 (Lifetime Min/Max 22/45)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 76
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 14
223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 5

SMART Error Log Version: 1
ATA Error Count: 76 (device log contains only the most recent five errors)

CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 76 occurred at disk power-on lifetime: 1903 hours (79 days + 7 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 01 4f c2 00 0a 00:12:14.194 SMART READ LOG
b0 d5 01 01 4f c2 00 0a 00:12:14.194 SMART READ LOG
35 00 08 1a 2d 11 e0 0a 00:12:14.194 WRITE DMA EXT
c8 00 08 6a e0 5d ee 0a 00:12:14.194 READ DMA
ca 00 08 92 2b 43 e0 0a 00:12:14.194 WRITE DMA

Error 75 occurred at disk power-on lifetime: 1899 hours (79 days + 3 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 06 4f c2 00 0a 00:12:01.593 SMART READ LOG
b0 d5 01 06 4f c2 00 0a 00:12:01.593 SMART READ LOG
ea 00 00 99 44 1c e0 0a 00:12:01.593 FLUSH CACHE EXIT
35 00 08 92 44 1c e0 0a 00:12:01.593 WRITE DMA EXT
ea 00 00 00 4f c2 e0 0a 00:12:01.593 FLUSH CACHE EXIT

Error 74 occurred at disk power-on lifetime: 1894 hours (78 days + 22 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d0 01 00 4f c2 00 0a 00:11:41.793 SMART READ DATA
b0 d0 01 00 4f c2 00 0a 00:11:41.793 SMART READ DATA
b0 da 00 00 4f c2 00 0a 00:11:41.793 SMART RETURN STATUS
ea 00 00 99 44 1c e0 0a 00:11:41.790 FLUSH CACHE EXIT
35 00 08 92 44 1c e0 0a 00:11:41.790 WRITE DMA EXT

Error 73 occurred at disk power-on lifetime: 1886 hours (78 days + 14 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d5 01 01 4f c2 00 0a 00:11:12.993 SMART READ LOG
b0 d5 01 06 4f c2 00 0a 00:11:12.993 SMART READ LOG
b0 d0 01 00 4f c2 00 0a 00:11:12.993 SMART READ DATA
b0 da 00 00 4f c2 00 0a 00:11:12.993 SMART RETURN STATUS
ea 00 00 99 44 1c e0 0a 00:11:12.993 FLUSH CACHE EXIT

Error 72 occurred at disk power-on lifetime: 1866 hours (77 days + 18 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 d0 01 00 4f c2 00 0a 00:10:00.993 SMART READ DATA
b0 d0 01 00 4f c2 00 0a 00:10:00.993 SMART READ DATA
25 00 90 19 08 ef e0 0a 00:10:00.993 READ DMA EXT
25 00 90 81 07 ef e0 0a 00:10:00.993 READ DMA EXT
35 00 08 72 b9 41 e0 0a 00:10:00.993 WRITE DMA EXT

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 2021 -
# 2 Short offline Completed without error 00% 2019 -
# 3 Short offline Completed without error 00% 1995 -
# 4 Short offline Completed without error 00% 1971 -
# 5 Short offline Completed without error 00% 1947 -
# 6 Short offline Completed without error 00% 1922 -
# 7 Short offline Completed without error 00% 1899 -
# 8 Short offline Completed without error 00% 1875 -
# 9 Extended offline Completed without error 00% 1854 -
#10 Short offline Completed without error 00% 1851 -
#11 Short offline Completed without error 00% 1827 -
#12 Short offline Completed without error 00% 1803 -
#13 Short offline Completed without error 00% 1779 -
#14 Short offline Completed without error 00% 1755 -
#15 Short offline Completed without error 00% 1731 -
#16 Short offline Completed without error 00% 1707 -
#17 Extended offline Completed without error 00% 1686 -
#18 Short offline Completed without error 00% 1684 -
#19 Short offline Completed without error 00% 1660 -
#20 Short offline Completed without error 00% 1636 -
#21 Short offline Completed without error 00% 1612 -

SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

[Christian Franke]

Replying to sancho-82:

I get this error every few days for 2 of 4 drives (HD502HJ):
"Device: /dev/sdd, 209480318976 Currently unreadable (pending) sectors" (always 209480318976)

209480318976 = 0x30c6000000

The disk firmware probably reports something undocumented in the upper 16 bits of the 48-bit raw value. Or the SMART data is bogus at all due to a problem in the pass-through command.

The the upper 16 bits of the raw value could be ignored by using the BYTEORDER parameter of the -v directive:

/dev/sdd -v 197,hex48:3210 ...

This requires smartmontools 5.40.

followed by this:
"Device: /dev/sdb, Failed SMART usage Attribute: 197 Current_Pending_Sector."

From a different drive?

Do these messages reappear in next smartd check cycle?
Which controller/driver is used?

[Christian Franke]

No feedback since Mar 2011.