INTEL SSDSC2KB019T8
https://www.intel.com/content/dam/support/us/en/documents/solid-state-drives/Intel_SSD_Smart_Attrib_for_SATA.PDF
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-3.10.0-693.el7.x86_64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: INTEL SSDSC2KB019T8
Firmware Version: XCV10100
User Capacity: 1 920 383 410 176 bytes [1,92 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Oct 15 13:29:20 2018 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x79) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0
9 Power_On_Hours -O--CK 100 100 000 - 83
12 Power_Cycle_Count -O--CK 100 100 000 - 11
170 Unknown_Attribute PO--CK 100 100 010 - 0
171 Unknown_Attribute -O--CK 100 100 000 - 0
172 Unknown_Attribute -O--CK 100 100 000 - 0
174 Unknown_Attribute -O--CK 100 100 000 - 11
175 Program_Fail_Count_Chip PO--CK 100 100 010 - 47573764327
183 Runtime_Bad_Block -O--CK 100 100 000 - 0
184 End-to-End_Error PO--CK 100 100 090 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O---K 079 077 000 - 21 (Min/Max 14/24)
192 Power-Off_Retract_Count -O--CK 100 100 000 - 11
194 Temperature_Celsius -O---K 100 100 000 - 21
197 Current_Pending_Sector -O--C- 100 100 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
225 Unknown_SSD_Attribute -O--CK 100 100 000 - 102245
226 Unknown_SSD_Attribute -O--CK 100 100 000 - 20
227 Unknown_SSD_Attribute -O--CK 100 100 000 - 38
228 Power-off_Retract_Count -O--CK 100 100 000 - 4948
232 Available_Reservd_Space PO--CK 100 100 010 - 0
233 Media_Wearout_Indicator -O--CK 100 100 000 - 0
234 Unknown_Attribute -O--CK 100 100 000 - 0
235 Unknown_Attribute PO--CK 100 100 010 - 47573764327
241 Total_LBAs_Written -O--CK 100 100 000 - 102245
242 Total_LBAs_Read -O--CK 100 100 000 - 63671
243 Unknown_Attribute -O--CK 100 100 000 - 186440
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 8 Comprehensive SMART error log
0x03 GPL R/O 20 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 2 Extended self-test log
0x08 GPL R/O 2 Power Conditions log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 SATA NCQ Queued Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xb8 GPL,SL VS 1 Device vendor specific log
0xb9 GPL VS 3336 Device vendor specific log
0xb9 SL VS 8 Device vendor specific log
0xba GPL VS 1280 Device vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 8 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (20 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (2 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 21 Celsius
Power Cycle Min/Max Temperature: 14/24 Celsius
Lifetime Min/Max Temperature: 14/25 Celsius
Under/Over Temperature Limit Count: 0/0
Vendor specific:
00 00 2c 01 00 00 00 00 00 00 00 00 00 00 00 00
00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
SCT Error Recovery Control:
Read: Disabled
Write: Disabled
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 2) ==
0x01 0x008 4 11 --- Lifetime Power-On Resets
0x01 0x018 6 6700743178 --- Logical Sectors Written
0x01 0x020 6 154958345 --- Number of Write Commands
0x01 0x028 6 4172777354 --- Logical Sectors Read
0x01 0x030 6 9599465 --- Number of Read Commands
0x01 0x038 6 301349628 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 21 --- Current Temperature
0x05 0x010 1 20 --- Average Short Term Temperature
0x05 0x018 1 - --- Average Long Term Temperature
0x05 0x020 1 25 --- Highest Temperature
0x05 0x028 1 20 --- Lowest Temperature
0x05 0x030 1 21 --- Highest Average Short Term Temperature
0x05 0x038 1 20 --- Lowest Average Short Term Temperature
0x05 0x040 1 - --- Highest Average Long Term Temperature
0x05 0x048 1 - --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 73 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 36 --- Number of Hardware Resets
0x06 0x010 4 34 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 --- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x0007 4 0 R_ERR response for host-to-device non-data FIS
0x000a 4 20 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
Updated database, disk already added