1 | smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.12+bpo-amd64] (local build)
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2 | Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
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3 |
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4 | === START OF INFORMATION SECTION ===
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5 | Device Model: 64GB SATA Flash Drive
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6 | Serial Number: 121928328146
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7 | LU WWN Device Id: 5 dc663a cacb0077c
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8 | Firmware Version: SFDM1B4D
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9 | User Capacity: 64,023,257,088 bytes [64.0 GB]
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10 | Sector Size: 512 bytes logical/physical
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11 | Rotation Rate: Solid State Device
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12 | Form Factor: M.2
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13 | TRIM Command: Available
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14 | Device is: Not in smartctl database 7.3/5671
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15 | ATA Version is: ACS-2 (minor revision not indicated)
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16 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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17 | Local Time is: Fri Mar 21 18:45:38 2025 CET
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18 | SMART support is: Available - device has SMART capability.
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19 | SMART support is: Enabled
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20 | AAM feature is: Unavailable
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21 | APM level is: 254 (maximum performance)
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22 | Rd look-ahead is: Enabled
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23 | Write cache is: Enabled
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24 | DSN feature is: Unavailable
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25 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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26 | Unexpected SCT status 0x0000 (action_code=0, function_code=0)
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27 | Wt Cache Reorder: Unknown (SCT Feature Control command failed)
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28 |
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29 | === START OF READ SMART DATA SECTION ===
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30 | SMART Status not supported: Incomplete response, ATA output registers missing
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31 | SMART overall-health self-assessment test result: PASSED
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32 | Warning: This result is based on an Attribute check.
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33 |
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34 | General SMART Values:
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35 | Offline data collection status: (0x00) Offline data collection activity
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36 | was never started.
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37 | Auto Offline Data Collection: Disabled.
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38 | Self-test execution status: ( 0) The previous self-test routine completed
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39 | without error or no self-test has ever
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40 | been run.
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41 | Total time to complete Offline
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42 | data collection: ( 32) seconds.
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43 | Offline data collection
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44 | capabilities: (0x5b) SMART execute Offline immediate.
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45 | Auto Offline data collection on/off support.
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46 | Suspend Offline collection upon new
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47 | command.
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48 | Offline surface scan supported.
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49 | Self-test supported.
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50 | No Conveyance Self-test supported.
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51 | Selective Self-test supported.
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52 | SMART capabilities: (0x0003) Saves SMART data before entering
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53 | power-saving mode.
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54 | Supports SMART auto save timer.
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55 | Error logging capability: (0x01) Error logging supported.
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56 | General Purpose Logging supported.
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57 | Short self-test routine
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58 | recommended polling time: ( 2) minutes.
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59 | Extended self-test routine
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60 | recommended polling time: ( 24) minutes.
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61 | SCT capabilities: (0x003d) SCT Status supported.
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62 | SCT Error Recovery Control supported.
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63 | SCT Feature Control supported.
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64 | SCT Data Table supported.
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65 |
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66 | SMART Attributes Data Structure revision number: 16
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67 | Vendor Specific SMART Attributes with Thresholds:
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68 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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69 | 5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0
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70 | 9 Power_On_Hours -O--CK 100 100 000 - 33896
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71 | 12 Power_Cycle_Count -O--CK 100 100 000 - 85
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72 | 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
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73 | 176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
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74 | 177 Wear_Leveling_Count -O--CK 100 100 000 - 51250063
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75 | 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 0
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76 | 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 0
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77 | 180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 496
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78 | 181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
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79 | 182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
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80 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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81 | 194 Temperature_Celsius -O---K 060 060 030 - 40 (Min/Max 30/60)
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82 | 195 Hardware_ECC_Recovered POSR-K 100 100 050 - 0
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83 | 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
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84 | 238 Unknown_Attribute -O---K 074 074 000 - 196608782
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85 | 241 Total_LBAs_Written -O--CK 100 100 000 - 15013888023
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86 | 242 Total_LBAs_Read -O--CK 100 100 000 - 5094828642
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87 | ||||||_ K auto-keep
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88 | |||||__ C event count
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89 | ||||___ R error rate
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90 | |||____ S speed/performance
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91 | ||_____ O updated online
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92 | |______ P prefailure warning
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93 |
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94 | General Purpose Log Directory Version 1
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95 | SMART Log Directory Version 1 [multi-sector log support]
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96 | Address Access R/W Size Description
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97 | 0x00 GPL,SL R/O 1 Log Directory
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98 | 0x01 SL R/O 1 Summary SMART error log
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99 | 0x02 SL R/O 51 Comprehensive SMART error log
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100 | 0x03 GPL R/O 64 Ext. Comprehensive SMART error log
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101 | 0x04 GPL,SL R/O 8 Device Statistics log
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102 | 0x06 SL R/O 1 SMART self-test log
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103 | 0x07 GPL R/O 1 Extended self-test log
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104 | 0x09 SL R/W 1 Selective self-test log
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105 | 0x10 GPL R/O 1 NCQ Command Error log
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106 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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107 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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108 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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109 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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110 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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111 |
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112 | SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
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113 | No Errors Logged
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114 |
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115 | SMART Extended Self-test Log Version: 1 (1 sectors)
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116 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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117 | # 1 Short offline Completed without error 00% 33896 -
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118 | # 2 Short offline Interrupted (host reset) 00% 2 -
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119 |
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120 | SMART Selective self-test log data structure revision number 1
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121 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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122 | 1 0 0 Not_testing
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123 | 2 0 0 Not_testing
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124 | 3 0 0 Not_testing
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125 | 4 0 0 Not_testing
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126 | 5 0 0 Not_testing
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127 | Selective self-test flags (0x0):
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128 | After scanning selected spans, do NOT read-scan remainder of disk.
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129 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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130 |
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131 | SCT Status Version: 3
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132 | SCT Version (vendor specific): 1 (0x0001)
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133 | Device State: Active (0)
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134 | Current Temperature: 0 Celsius
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135 | Power Cycle Min/Max Temperature: --/ 0 Celsius
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136 | Lifetime Min/Max Temperature: --/ 0 Celsius
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137 |
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138 | Unexpected SCT status 0x0000 (action_code=0, function_code=0)
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139 | Read SCT Temperature History failed
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140 |
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141 | Unexpected SCT status 0x0000 (action_code=0, function_code=0)
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142 | SCT (Get) Error Recovery Control command failed
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143 |
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144 | Device Statistics (GP Log 0x04)
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145 | Page Offset Size Value Flags Description
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146 | 0x01 ===== = = === == General Statistics (rev 2) ==
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147 | 0x01 0x008 4 85 --- Lifetime Power-On Resets
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148 | 0x01 0x018 6 15013888023 --- Logical Sectors Written
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149 | 0x01 0x020 6 905365889 --- Number of Write Commands
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150 | 0x01 0x028 6 5094826520 --- Logical Sectors Read
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151 | 0x01 0x030 6 115874273 --- Number of Read Commands
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152 | 0x01 0x038 6 122025600000 --- Date and Time TimeStamp
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153 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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154 | 0x07 0x008 1 36 N-- Percentage Used Endurance Indicator
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155 | |||_ C monitored condition met
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156 | ||__ D supports DSN
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157 | |___ N normalized value
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158 |
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159 | Pending Defects log (GP Log 0x0c) not supported
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160 |
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161 | SATA Phy Event Counters (GP Log 0x11)
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162 | ID Size Value Description
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163 | 0x0001 2 0 Command failed due to ICRC error
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164 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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165 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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166 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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167 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS
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168 | 0x0008 2 0 Device-to-host non-data FIS retries
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169 | 0x0009 4 0 Transition from drive PhyRdy to drive PhyNRdy
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170 | 0x000a 4 1 Device-to-host register FISes sent due to a COMRESET
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171 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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172 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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173 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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174 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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175 |
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